Rack-Mounted, USB & Ethernet Control 80-Channel High Power Integrated Test System, 700-2700 MHz, 3W per Channel - HTOL-700-2700-3W Mini-Circuits

THE BIG DEAL

- Fully integrated test system
- 80 output channels
- 3W saturated power per channel
- Coverage of 700-2700 MHz cellular bands

Applications

- High Temperature Operating Life (HTOL)
- High power burn-in, RF stress testing
- Semi-conductor, component qualification
- High power signal source & distribution
- EMC - EMI testing

PRODUCT OVERVIEW

HTOL (high temperature operating life) is a test methodology intended to stress a device over an extended period of time, allowing calculation of a device’s long-term reliability. The test is applicable to a wide range of component manufacturing applications, IC manufacturers in particular, including amplifiers, filters and transceivers.

The concept requires a high power signal source and an RF splitter system to distribute a test signal over a large number of DUT (device under test) channels in parallel, allowing a statistically significant calculation of reliability to be made.

HTOL-700-2700-3W is a ready-made, integrated test system, designed for HTOL, burn-in test applications. The complete setup is supplied in a standard 19” rack cabinet and is capable of driving 80 parallel DUT at 3W each in the 700-2700 MHz band.

The signal source can be controlled via USB or Ethernet (supporting both HTTP and Telnet network protocols). Full software support is provided, including our user-friendly GUI application for Windows and a full API with programming instructions for Windows and Linux environment.